Electric Power ›› 2019, Vol. 52 ›› Issue (8): 16-25.DOI: 10.11930/j.issn.1004-9649.201805131

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Influence of Package Parasitic Parameters on Transient Current Distribution of Paralleled IGBT Chips

SHI Hao1, WU Pengfei1, TANG Xinling1, DONG Jianjun2, HAN Ronggang1, ZHANG Peng1   

  1. 1. Global Energy Interconnection Research Institute Co. Ltd., Beijing 102209, China;
    2. State Grid Jincheng Electric Power Supply Company, Jincheng 033000, China
  • Received:2018-05-22 Revised:2018-11-19 Published:2019-08-14
  • Supported by:
    This work is supported by National Science and Technology Major Project (No.2015ZX02301), Science and Technology Projects of SGCC (No.GEIRI-GB-71-17-001).

Abstract: High power IGBT usually use multiple chips in parallel to achieve large current. The consistency of the dynamic and static current distribution of parallel chips is essential to improve the current level and reliability of devices.At first, the difference of package parasitic parameters caused by inconsistent internal layout of paralleled IGBT chips is introduced in this paper. Secondly, combined with the equivalent circuit model of IGBT and its switching characteristics, the influence of parasitic parameters on the transient current distribution characteristics of parallel IGBT chips is analyzed. Then, the equivalent circuit model of parallel IGBT chip is established, and the simulation circuit is built by Synopsys Saber software. From the differences of package parasitic inductance parameters and package parasitic resistance parameters, the influence of parameters differences on the transient current distribution characteristics of parallel chip is analyzed. In this paper, the influence of various package parasitic parameters on the transient current distribution is considered comprehensively, which is of great significance for optimizing the transient current consistency of multi-chip parallel connection.

Key words: IGBT, parallel chips, parasitic inductance, parasitic resistance, transient current distribution

CLC Number: