汽车级IGBT模块功率循环及温度循环寿命对比与分析

doi:10.11930/j.issn.1004-9649.201907058

中国电力 ›› 2019, Vol. 52 ›› Issue (9): 54-60.DOI: 10.11930/j.issn.1004-9649.201907058

• 电力电子器件可靠性专栏 • 上一篇下一篇

汽车级IGBT模块功率循环及温度循环寿命对比与分析

张瑾, 仇志杰, 王磊, 宁圃奇

中国科学院电工研究所电力电子与电能变换技术实验室, 北京 100190

收稿日期:2019-07-05 修回日期:2019-07-16 出版日期:2019-09-05 发布日期:2019-09-19
作者简介:张瑾(1980-),男,博士,高级工程师,从事功率半导体测试技术及可靠性研究,E-mail:ejzhang@mail.iee.ac.cn
基金资助:
国家重点研发计划资助项目（2018YFB0104500）。

Comparison and Analysis of Power Cycling and Thermal Cycling Lifetime of Power Semiconductor Modules for Vehicles

ZHANG Jin, QIU Zhijie, WANG Lei, NING Puqi

Key Laboratory of Power Electronics and Electric Drive, Institute of Electrical Engineering of Chinese Academy of Sciences, Beijing 100190, China

Received:2019-07-05 Revised:2019-07-16 Online:2019-09-05 Published:2019-09-19
Supported by:
This research is supported by National Key R&D Program of China (No.2018YFB0104500).

摘要/Abstract

摘要： 随着电动汽车领域越来越多地使用绝缘栅极晶体管（IGBT）模块，在这些关乎乘员安全的场合，通常要求IGBT模块具有更高的可靠性。选取了典型的汽车级和工业级IGBT模块产品，分别进行了功率循环和温度循环试验，对比了2种模块的可靠性差异，结果表明，汽车级模块产品的功率循环寿命较工业级产品差，但是温度循环寿命明显优于工业级产品。

关键词: 绝缘栅双极晶体管, 功率循环, 温度循环, 可靠性

Abstract: The power semiconductor module is more and more widely used in human transportation field, like electric vehicle and high-speed train. These applications in which the personnel safety is seriously concerned usually require power modules with higher reliability. In this paper, the typical automotive and industrial grade insulated gate bipolar transistors (IGBT) were selected. Both the power cycling and thermal cycling tests were carried out to compare the reliability differences. The experimental results showed that the thermal cycling lifetime of automotive IGBTs was obviously better than that of industrial grade products. However, the power cycling lifetime of automotive IGBT was worse than that of the industrial grade product.

Key words: IGBT, power cycling, thermal cycling, reliability

中图分类号:

TN322

张瑾, 仇志杰, 王磊, 宁圃奇. 汽车级IGBT模块功率循环及温度循环寿命对比与分析[J]. 中国电力, 2019, 52(9): 54-60.

ZHANG Jin, QIU Zhijie, WANG Lei, NING Puqi. Comparison and Analysis of Power Cycling and Thermal Cycling Lifetime of Power Semiconductor Modules for Vehicles[J]. Electric Power, 2019, 52(9): 54-60.

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参考文献

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汽车级IGBT模块功率循环及温度循环寿命对比与分析

Comparison and Analysis of Power Cycling and Thermal Cycling Lifetime of Power Semiconductor Modules for Vehicles

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汽车级IGBT模块功率循环及温度循环寿命对比与分析

Comparison and Analysis of Power Cycling and Thermal Cycling Lifetime of Power Semiconductor Modules for Vehicles

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