压接型IGBT功率模块加速老化试验方法

doi:10.11930/j.issn.1004-9649.202108087

中国电力 ›› 2022, Vol. 55 ›› Issue (10): 87-91.DOI: 10.11930/j.issn.1004-9649.202108087

压接型IGBT功率模块加速老化试验方法

李标俊¹, 褚海洋¹, 庄志发¹, 文军^2,*

1. 中国南方电网有限责任公司超高压输电公司天生桥局，贵州兴义　562400;
2. 荣信汇科电气股份有限公司，辽宁鞍山　114051

收稿日期:2021-08-24 修回日期:2022-09-06 发布日期:2022-10-20
通讯作者: 文军（1991—），男，通信作者，硕士，从事柔性直流换流阀研究，E-mail：wenjun@rxhk.com
作者简介:李标俊（1982—），男，高级工程师，从事高压直流输电运行维护研究，E-mail：libiaojun@163.com
基金资助:
中国南方电网有限责任公司科技项目（CGYKJXM20180173）。

Accelerate Aging Test Method for Press-Pack IGBT Power Module

LI Biaojun¹, CHU Haiyang¹, ZHUANG Zhifa¹, WEN Jun^2,*

1. Tianshengqiao Bureau, EHV Transmission Company of China Southern Power Grid Co., Ltd., Xingyi 562400, China;
2. Rongxin Huiko Electric Co., Ltd., Anshan 114051, China

Received:2021-08-24 Revised:2022-09-06 Published:2022-10-20
Supported by:
This work is supported by Science and Technology Project of China Southern Power Grid Corporation (No.CGYKJXM20180173).

摘要/Abstract

摘要： 针对目前对压接型绝缘栅双极型晶体管（insulated gate bipolar transistor ，IGBT）可靠性评估测试工作的不足，从器件应用角度提出了可用于柔直功率模块的老化循环试验方法。结合不同试验工况下的理想试验波形及热阻模型得到了适用于不同试验的结温波动公式。通过实验验测得到了压接型IGBT在老化试验下的结温波动波形，对所提方法进行了验证。

关键词: 压接型IGBT, 结温, 循环老化, 热阻抗

Abstract: Since reliability test of Press-pack IGBT (PPI) still not been researched enough, based on its application in industry, A cycle aging test methods aimed at VSC-HVDC power unit are proposed. The junction temperature formulas for all test methods are obtained by analyzing promising test waveforms and thermal impedance models under the specific test conditions. Experiments results illustrate measured junction temperature waveforms of PPI that under the aging tests, and proposed methods are validated.

Key words: press-pack IGBT, junction-temperature, cycle aging, thermal-impedance

李标俊, 褚海洋, 庄志发, 文军. 压接型IGBT功率模块加速老化试验方法[J]. 中国电力, 2022, 55(10): 87-91.

LI Biaojun, CHU Haiyang, ZHUANG Zhifa, WEN Jun. Accelerate Aging Test Method for Press-Pack IGBT Power Module[J]. Electric Power, 2022, 55(10): 87-91.

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https://www.electricpower.com.cn/CN/Y2022/V55/I10/87

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压接型IGBT功率模块加速老化试验方法

Accelerate Aging Test Method for Press-Pack IGBT Power Module

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