Performance Degradation Based Lifetime Evaluation of Power Electronic Devices

doi:10.11930/j.issn.1004-9649.201907027

Abstract

Abstract: Current lifetime evaluation methods are often ineffective for power electronic devices which have high reliability, long life, and multi-fault mode competition. Accordingly, a lifetime evaluation method based on performance degradation data is proposed. Such data is used to construct performance degradation and lifetime distribution models. Then, the model parameter estimation, model goodness-of-fit checking, and model optimization methods are derived. By considering the trends in the degradation of multiple performance parameters, a competitive failure model is constructed to achieve a fast evaluation for the lifetime of power electronic devices with high reliability, long life, and multi-fault mode competition. As an example, lifetime evaluation is carried out for an insulated gate bipolar transistor. The difference between the evaluation results and measured test results is small, which verifies that the proposed method is quite accurate and effective.

Key words: power electronic devices, performance degradation model, lifetime distribution model, competitive failure model, lifetime evaluation

PAN Guangze, ZHANG Zheng, LUO Qin, LI Xiaobing, MENG Linghui. Performance Degradation Based Lifetime Evaluation of Power Electronic Devices[J]. Electric Power, 2020, 53(10): 156-162.

Add to citation manager EndNote|Ris|BibTeX

URL: https://www.electricpower.com.cn/EN/10.11930/j.issn.1004-9649.201907027

https://www.electricpower.com.cn/EN/Y2020/V53/I10/156

References

[1] 盛况, 郭清. 碳化硅电力电子器件在电网中的应用展望[J]. 南方电网技术, 2016, 10(3): 87-90
SHENG Kuang, GUO Qing. Prospects of sic power electronic device application in power grid[J]. Southern Power System Technology, 2016, 10(3): 87-90
[2] 刘佳佳, 刘英坤, 谭永亮. SiC电力电子器件研究现状及新进展[J]. 半导体技术, 2017, 42(10): 744-753
LIU Jiajia, LIU Yingkun, TAN Yongliang. Research status and new progress of SiC power electronic devices[J]. Semiconductor Technology, 2017, 42(10): 744-753
[3] 魏劲夫. 探究电力电子器件及其应用的现状和发展[J]. 电子测试, 2017(7): 114-115
WEI Jinfu. Current situation and development of power electronic devices and their applications[J]. Electronic Test, 2017(7): 114-115
[4] 钱照明, 张军明, 盛况. 电力电子器件及其应用的现状和发展[J]. 中国电机工程学报, 2014, 34(29): 5149-5161
QIAN Zhaoming, ZHANG Junming, SHENG Kuang. Status and development of power semiconductor devices and its applications[J]. Proceedings of the CSEE, 2014, 34(29): 5149-5161
[5] 曾凡兴, 赵谦, 余祥坤, 等. 变电站高压断路器新型选相控制器研究[J]. 电力系统保护与控制, 2018, 44(22): 143-148
ZENG Fanxing, ZHAO Qian, YU Xiangkun, et al. Study of controlled switching device for high-voltage circuit breaker in substation[J]. Power System Protection and Control, 2018, 44(22): 143-148
[6] 蔡涛, 段善旭, 康勇. 电力电子系统故障诊断技术研究综述[J]. 电测与仪表, 2008, 45(509): 1-7, 48
CAI Tao, DUAN Shanxu, KANG Yong. A survey of fault diagnosis technology for power electronics system[J]. Electrical Measurement & Instrumentation, 2008, 45(509): 1-7, 48
[7] 周雒维, 吴军科, 杜雄, 等. 功率变流器的可靠性研究现状及展望[J]. 电源学报, 2013, 11(1): 1-15
ZHOU Luowei, WU Junke, DU Xiong, et al. Status and outlook of power converter’s reliability research[J]. Journal of Power Supply, 2013, 11(1): 1-15
[8] 徐帅, 杨欢, 王田刚, 等. 电力电子变换器可靠性研究[J]. 北京交通大学学报, 2015, 39(5): 125-132
XU Shuai, YANG Huan, WANG Tiangang, et al. Research on reliability of power electronic converter[J]. Journal of Beijing Jiaotong University, 2015, 39(5): 125-132
[9] ROMERO-LOPEZ R, CARLOS M L, ALBERTO R L, et al. Reliability analysis for electronic devices using beta-Weibull distribution[J]. Quality and reliability engineering international, 2017, 33(8): 2521-2530.
[10] SONG Y, WANG B. Survey on reliability of power electronic systems[J]. IEEE Transactions on Power Electronics, 2013, 28(1): 591-604.
[11] LUO P, LONG H Y, NARA Y E, et al. A novel approach to suppvess the collector-induced barrier lowering effect in narrow mesa IGBTs[J]. IEEE Electron Devlce Letters, 2018, 39(9): 1350-1353.
[12] 杨欢. 开关磁阻电机驱动系统可靠性研究[D]. 徐州: 中国矿业大学, 2015.
YANG Huan. Study on reliability of switched reluctance drive[D]. Xuzhou: China University of Mining and Technology, 2015.
[13] 谷磊. 智能变电站继电保护可靠性研究[D]. 广州: 广东工业大学, 2014.
GU Lei. The research on reliability of smart substation relay protection system[D]. Guangzhou: Guangdong University of Technology, 2014.
[14] Reliability prediction of electronic equipment MIL-HDBK-217F[S]. Washington DC: Department of Defense, 1991.
[15] 电子设备可靠性预计手册: GJB/Z 299C—2006[S]. 北京: 国防科学技术工业委员, 2006.
[16] RDF2000 Reliability data handbook[S]. France: Union Technology de LEtricitee, 2000.
[17] 李洁, 赖伟, 汪纪锋, 等. IGBT的加速老化试验方法研究[J]. 电力电子技术, 2018, 52(8): 73-76
LI Jie, LAI Wei, WANG Jifeng, et al. Study on accelerated ageing methods for IGBT[J]. Power Electronics, 2018, 52(8): 73-76
[18] 彭波, 徐梦蕾, 王荀, 等. 自愈式电容器加速电老化试验及寿命估计[J]. 科学技术与工程, 2017, 17(31): 239-244
PENG Bo, XU Menglei, WANG Xun, et al. Accelerated electrical aging experiment of self-healing capacitor and its lifetime evaluation[J]. Science Technology and Engineering, 2017, 17(31): 239-244
[19] 李玲玲, 孙进, 张鑫保. 考虑性能退化的IGBT模块可靠性度量模型[J]. 半导体技术, 2018, 43(12): 930-935
LI Lingling, SUN Jin, ZHANG Xinbao. Reliability measurement model of IGBT modules considering the performance degradation[J]. Semiconductor Technology, 2018, 43(12): 930-935
[20] 李亚萍, 周雒维, 孙鹏菊, 等. 基于特定集电极电流下饱和压降的IGBT模块老化失效状态监测方法[J]. 电工技术学报, 2018, 33(14): 3202-3212
LI Yaping, ZHOU Luowei, SUN Pengju, et al. Condition monitoring for IGBT module aging failure on VCE(on) under certain IC conditions[J]. Transactions of China Electrotechnical Society, 2018, 33(14): 3202-3212
[21] HAQUE, M S, CHOI S, BAEK J. Auxiliary Particle filtering-based estimation of remaining useful life of IGBT[J]. IEEE Transactions on Industrial Electronics, 2018, 65(3): 2693-2703.
[22] PEDERSEN K B, OSTERGAARD L H, KRISTENSEN P K, et al. Degradation evolution in high power IGBT modules subjected to sinusoidal current load[J]. Journal of Materials Science. Materials in Electronics, 2016, 27(2): 1938-1945.
[23] 黄周霖, 王召斌, 王佳炜. 基于性能退化数据的可靠性评估方法综述[J]. 电器与能效管理技术, 2017(19): 35-40
HUANG Zhoulin, WANG Zhaobin, WANG Jiawei. Review of reliability evaluation methods based on performance degradation data[J]. Low Voltage Apparatus, 2017(19): 35-40
[24] 赵宇. 可靠性数据分析[M]. 北京: 国防工业出版社, 2014: 36-50.
[25] 苏夏莹. 线性回归模型误差分布的拟合优度检验[D]. 北京: 华北电力大学, 2015.
SU Xiaying. Goodness-of-Fit Test for error distribution in linear regression model[D]. Beijng, North China Electric Power University, 2015.
[26] 罗静, 陈一凡, 张根保, 等. 数控磨床可靠性模型优选与分析[J]. 现代制造工程, 2018(11): 119-125
LUO Jing, CHEN Yifan, ZHANG Genbao, et al. Optimum reliability model and analysis for CNC grinding machine[J]. Modern Manufacturing Engineering, 2018(11): 119-125
[27] 陈循, 张春华, 汪亚顺, 等. 加速寿命试验技术与应用[M]. 北京: 国防工业出版社, 2013: 19.
[28] BEUTEL A A. A novel test method for minimising energycosts in IGBT power cycling studies[D]. Johannesbury: Faculty of Engineering and the Built Environment, University of the Witwatersrand, 2006.