基于性能退化的电力电子器件寿命评估

doi:10.11930/j.issn.1004-9649.201907027

中国电力 ›› 2020, Vol. 53 ›› Issue (10): 156-162.DOI: 10.11930/j.issn.1004-9649.201907027

基于性能退化的电力电子器件寿命评估

潘广泽¹, 张铮², 罗琴¹, 李小兵³, 孟苓辉¹

1. 工业和信息化部电子第五研究所，广东广州 510610;
2. 广东省电子信息产品可靠性技术重点实验室，广东广州 510610;
3. 广东省电子信息产品可靠性与环境工程技术研究开发中心，广东广州 510610

收稿日期:2019-07-03 修回日期:2019-07-19 发布日期:2020-10-05
作者简介:潘广泽(1989—)，男，硕士研究生，从事电力电子产品可靠性与环境适应性研究，E-mail：panguangze@126.com;张铮(1966—)，女，本科，高级工程师，从事电力电子产品可靠性与环境适应性研究，E-mail：zhangzh@ceprei.com;罗琴(1987—)，女，通信作者，硕士研究生，高级工程师，从事电力电子产品可靠性分析与评价研究，E-mail: ceprei14790@163.com
基金资助:
国家重点研发计划资助项目(特高压大容量远距离架空线柔性直流输电技术研究，2016YFB0901002)。

Performance Degradation Based Lifetime Evaluation of Power Electronic Devices

PAN Guangze¹, ZHANG Zheng², LUO Qin¹, LI Xiaobing³, MENG Linghui¹

1. China Electronic Product Reliability and Environmental Testing Research Institute, Guangzhou 510610, China;
2. Guangdong Provincial Key Laboratory of Electronic Information Products Reliability Technology, Guangzhou 510610, China;
3. Guangdong Provincial Research Center of Electronic Information Products Reliability and Environment Engineering Technology, Guangzhou 510610, China

Received:2019-07-03 Revised:2019-07-19 Published:2020-10-05
Supported by:
This work is supported by the National Key Research and Development Program of China (Research on Flexible DC Transmission Technology of UHV Large Capacity Long Distance Overhead Line, No.2016YFB0901002).

摘要/Abstract

摘要： 针对目前的寿命评估方法不能满足高可靠、长寿命以及多故障模式竞争的电力电子器件寿命评估需求，提出了基于性能退化的电力电子器件寿命评估方法。通过收集电力电子器件的性能退化数据，建立其性能退化模型和寿命分布模型，给出性能退化模型和寿命分布模型的模型参数估计、模型拟合优度检验以及模型优选方法。考虑到电力电子器件具有多个性能参数的退化，提出电力电子器件竞争失效模型，实现对高可靠、长寿命以及多故障模式竞争的电力电子器件寿命快速评估。以某型绝缘栅双极型晶体管为例开展寿命评估，评估结果和试验结果差距较小，验证了该方法具有良好的准确性和有效性。

关键词: 电力电子器件, 性能退化模型, 寿命分布模型, 竞争失效模型, 寿命评估

Abstract: Current lifetime evaluation methods are often ineffective for power electronic devices which have high reliability, long life, and multi-fault mode competition. Accordingly, a lifetime evaluation method based on performance degradation data is proposed. Such data is used to construct performance degradation and lifetime distribution models. Then, the model parameter estimation, model goodness-of-fit checking, and model optimization methods are derived. By considering the trends in the degradation of multiple performance parameters, a competitive failure model is constructed to achieve a fast evaluation for the lifetime of power electronic devices with high reliability, long life, and multi-fault mode competition. As an example, lifetime evaluation is carried out for an insulated gate bipolar transistor. The difference between the evaluation results and measured test results is small, which verifies that the proposed method is quite accurate and effective.

Key words: power electronic devices, performance degradation model, lifetime distribution model, competitive failure model, lifetime evaluation

潘广泽, 张铮, 罗琴, 李小兵, 孟苓辉. 基于性能退化的电力电子器件寿命评估[J]. 中国电力, 2020, 53(10): 156-162.

PAN Guangze, ZHANG Zheng, LUO Qin, LI Xiaobing, MENG Linghui. Performance Degradation Based Lifetime Evaluation of Power Electronic Devices[J]. Electric Power, 2020, 53(10): 156-162.

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